Industry
Semiconductor & Electronics
Microsecond-level signal capture and quality tracing
Capture subtle fab signals at microsecond resolution and trace anomalies and yield drops early. Supports the SECS/GEM standard.
Yield shows up in subtle signals first. Connect fab equipment directly over the SECS/GEM standard and accumulate even small cleanroom drifts as time series — and the data warns you of yield degradation before it lands.
A Challenges
Ultra-high-frequency signal capture
Tracing yield-drop causes
Cleanroom environment monitoring
On-premises processing for data that cannot leave the fab
B How PlantPulse helps
SECS/GEM collection
Connect fab equipment directly with the SECS/GEM standard (SEMI E5/E30/E37).
High-frequency edge processing
Capture subtle signals at high speed on the edge and compute derived metrics instantly.
Yield forecasting & anomaly detection
Catch subtle anomalies and yield drops early with AI forecasting and anomaly detection.
Cleanroom time-series analytics
Compare long-term environmental-sensor trends against baselines to catch subtle drift and degradation early.
Process–lot traceability
Link process, lot, and equipment history through the ontology to back-trace the impact scope of quality issues.
Utility peak monitoring
Continuously watch cleanroom HVAC and compressed-air peaks with early alarms before thresholds are exceeded.
SECS/GEM
SEMI E5·E30·E37 standard
µs-class
signal capture resolution
512K
CEP events/sec
24/7
continuous cleanroom watch
C Where it applies
Connect equipment directly as a SECS/GEM host to collect events, states, and subtle signals in standard form.
Standard direct-to-tool collection
Tie environmental sensors and equipment signals into one time-series foundation to analyze the downstream impact of subtle changes.
Early awareness of subtle anomalies
Unify heterogeneous assembly and inspection equipment and trace per-lot quality history.
Faster yield-drop root-cause tracing
C Outcomes
- Early subtle-anomaly detection
- Yield forecasting
- Quality tracing
D Related products
D FAQ
Can we connect without tool-vendor involvement?
Equipment supporting SECS/GEM is collected directly over a host connection. For non-standard equipment, PLC and sensor signals are collected in parallel with the 42 built-in drivers.
Does fab data have to leave the site?
No. Both the platform and the AI run fully on-premises, so data never leaves the site — suitable for fabs with strict no-egress policies.
Won't high-frequency collection load the tools?
Host communication follows the SECS/GEM specification with per-tool polling adjustment, and preprocessing and derived metrics run on the edge to reduce upstream load.
See it live on real operating screens
A 15-minute demo walks you from ingest to AI. Check the fit for your plant with an expert, right away.